JEOL JEM ARM200f NEOARM

The NEOARM is a probe aberration corrected S/TEM with a Cold Field Emission Gun (cFEG), the first-of-its-kind in Virginia Tech, with the following features:

•Source: Cold Field Emission gun
•Aberration corrector alignment: High-precision correction of higher order aberrations up to 5th order.
•Acceleration voltage at 80 and 200kV
•Resolution: STEM HAADF image 0.07 nm (200 kV), 0.10 nm (80 kV);
•TEM: 0.1 nm (200 kV), 0.11 nm (80 kV)
•Detectors: STEM BF, HAADF, OBF.
•EDS: 100mm2 SDD ×2
•ClearView camera: 50 fps at 4k × 4k, 1600 fps at 256 × 256.

Current Status and Upcoming Availability of the NEOARM

•Installation and initial setup: The main instrument has been successfully installed and is currently undergoing a series of critical setup procedures including debugging, calibration, and alignment to ensure optimal performance.

•Qualification tests: Scheduled for early August, these tests are designed to verify that the microscope meets all operational standards. Successful completion of these tests is crucial for ensuring reliability and precision in future research applications.

•Availability for scheduling: Pending successful qualification and meeting performance standards, the NEOARM Microscope is expected to be available for scheduling soon after the tests in early August. This will allow researchers to start planning their projects with access to cutting-edge atomic resolution analytical capabilities.

•Stay updated: We encourage all potential users to stay tuned for further updates on the qualification results and the exact date when the microscope will become available for booking.

NEOARM demo images

GaN [211]:200 kV

Si [110]:80 kV