JEOL JEM ARM200f NEOARM

The NEOARM is a probe aberration corrected S/TEM with a Cold Field Emission Gun (cFEG), the first-of-its-kind in Virginia Tech, with the following features:
•Source: Cold Field Emission gun
•Aberration corrector alignment: High-precision correction of higher order aberrations up to 5th order.
•Acceleration voltage at 80 and 200kV
•Resolution: STEM HAADF image 0.07 nm (200 kV), 0.10 nm (80 kV);
•TEM: 0.1 nm (200 kV), 0.11 nm (80 kV)
•Detectors: STEM BF, HAADF, OBF.
•EDS: 100mm2 SDD ×2
•ClearView camera: 50 fps at 4k × 4k, 1600 fps at 256 × 256.
Contact: Hongyu Wang (hongyuw@vt.edu)
Location: ICTAS CRC room 1010B
NEOARM demo images
GaN [211]:200 kV
![GaN [211]:200kV](/content/ncfl_ictas_vt_edu/en/instruments/jeol-jem-arm200f-neoarm/_jcr_content/content/adaptiveimage.transform/m-medium/image.png)
Si [110]:80 kV
![Si[110]:80kV Si[110]:80kV](/content/ncfl_ictas_vt_edu/en/instruments/jeol-jem-arm200f-neoarm/_jcr_content/content/adaptiveimage_1772527324.transform/m-medium/image.png)