JEOL IB-19520CCP Cooling Cross Section Polisher
Contact: Weinan Leng (wleng@vt.edu)
Location: ICTAS CRC room 1022
The JEOL IB-19520CCP Cooling Cross Section Polisher is used for cutting away thin materials and leaving a smooth surface so that the material can be viewed in cross-section using an SEM, a FIB/SEM, microprobe, or other suitable imaging tool. Any samples being processed to make cross sections must first be pre-prepared to have dimensions less than 10 mm x 8 mm x 3 mm. More information is available on JEOL's website.