PHI Quantera Hybrid XPS
![XPS XPS](/content/ncfl_ictas_vt_edu/en/instruments/phiquanterahybrid/_jcr_content/article-image.transform/m-medium/image.jpg)
The PHI Quantera Hybrid is an upgraded model of the PHI Quantera SXM, a Scanning X-ray Microscope used for the quantitative analysis of chemical elements and chemical states within the top few nanometers of a surface. The Quantera Hybrid enables analysis of both a very small area of user interest and a large area of the uniform sample surface. Depth profiling can be accomplished with automated ion milling. Angle resolved XPS provides a nondestructive analysis of ultra-thin films, revealing thickness, composition and chemical state of each elements.
Contact: Weinan Leng (wleng@vt.edu)
Location: ICTAS CRC room 1014
PHI Quantera Hybrid is equipped with:
- A scanning monochromatic Al K⍺ (1486.7 eV) x-ray source with a highly focused beam in selectable size from 9 to 200 microns
- Sample positioning station for high magnification images of the specimen surface and ease in locating analysis points
- Multi-style sample platens, automated sample introduction and stage movement
- Heating stage (up to 300 ℃)